Supriya B K, Arunraja A, Bremiga Gopalan Gandhimathi, S Sheeba Rani, N Sudhakar Reddy, & Deepali Rani Sahoo. (2025). DFT Aware Test Architecture for Communication ICs: ATPG- Based Fault Detection on Lower Technology Node. Journal of VLSI Circuits and Systems, 7(1), 106–117. https://doi.org/10.31838/jvcs/07.01.13