NGUYEN TAN DANH. Analysis of Reliability for Flash Type Analog to Digital Converter. Journal of VLSI Circuits and Systems, [S. l.], v. 2, n. 2, p. 5–8, 2020. DOI: 10.31838/jvcs/02.02.02. Disponível em: https://vlsijournal.com/index.php/vlsi/article/view/16. Acesso em: 23 oct. 2024.