K. NAGABUSHANAM; SRIADIBHATLA SRIDEVI. VLSI Circuits–Oriented Gate-Length-Dependent DC–RF Compact Modeling of AlInN/AlN/GaN MISHEMTs with SSEC Extraction. Journal of VLSI Circuits and Systems, [S. l.], v. 7, n. 2, p. 9–22, 2025. DOI: 10.31838/JVCS/07.02.02. Disponível em: https://vlsijournal.com/index.php/vlsi/article/view/281. Acesso em: 21 jan. 2026.