NGO TIEN; MIROSLAV VOZNA. HIGH SPEED AND RELIABLE DOUBLE EDGE TRIGGERED D- FLIP-FLOP FOR MEMORY APPLICATIONS. Journal of VLSI Circuits and Systems, [S. l.], v. 1, n. 1, p. 13–17, 2019. DOI: 10.31838/jvcs/01.01.04. Disponível em: https://vlsijournal.com/index.php/vlsi/article/view/7. Acesso em: 4 dec. 2024.