N, R.; SWANAND KULKARNI. Smart Ways to Catch the Abutment DRCs at IP Level. Journal of VLSI Circuits and Systems, [S. l.], v. 6, n. 1, p. 51–54, 2023. DOI: 10.31838/jvcs/06.01.08. Disponível em: https://vlsijournal.com/index.php/vlsi/article/view/90. Acesso em: 23 nov. 2024.