NGO TIEN, and MIROSLAV VOZNA. “HIGH SPEED AND RELIABLE DOUBLE EDGE TRIGGERED D- FLIP-FLOP FOR MEMORY APPLICATIONS”. Journal of VLSI Circuits and Systems 1, no. 1 (March 5, 2019): 13–17. Accessed December 4, 2024. https://vlsijournal.com/index.php/vlsi/article/view/7.